A method for side effect analysis based on electricfield simulations for intraoperative test stimulation in deep brain stimulation surgery

Pison, DanielaAlonso, FabiolaWårdell, KarinShah, AsheshCoste, JérômeLemaire, Jean-JaquesSchkommodau, ErikHemm-Ode, Simone2015-12-162015-12-162015http://hdl.handle.net/11654/11824deA method for side effect analysis based on electricfield simulations for intraoperative test stimulation in deep brain stimulation surgery04B - Beitrag Konferenzschrift