Rezaeizadeh, AminMastellone, Silvia2025-02-112025-02-10https://irf.fhnw.ch/handle/11654/50126https://doi.org/10.26041/fhnw-11938In this short note, we give a simple derivation of the damage calculation for power semiconductors based on the frequency-domain approximation of damage. This analysis can be further used to design linear control systems aimed at reducing the damage to the semiconductor switches in power converters.ensemiconductors lifetimefrequency-domain fatigue analysisreliability620 - Ingenieurwissenschaften und Maschinenbau05 - Forschungs- oder Arbeitsbericht