Measuring a Small Number of Samples, and the 3σ Fallacy. Shedding Light on Confidence and Error Intervals

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2014
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01A - Journal article
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IEEE Solid-State Circuits Magazine
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6
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2
Pages / Duration
52-58
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IEEE
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1943-0590
1943-0582
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Yes
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Review
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SCHMID, Hanspeter und Alexander HUBER, 2014. Measuring a Small Number of Samples, and the 3σ Fallacy. Shedding Light on Confidence and Error Intervals. IEEE Solid-State Circuits Magazine. 2014. Bd. 6, Nr. 2, S. 52–58. Verfügbar unter: http://hdl.handle.net/11654/17733