A novel image analysis technique for 2D characterization of overlapping needle-like crystals
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Author (Corporation)
Publication date
02.2022
Type of student thesis
Course of study
Type
01A - Journal article
Editors
Editor (Corporation)
Supervisor
Parent work
Powder Technology
Special issue
DOI of the original publication
Link
Related research data
Series
Series number
Volume
399
Issue / Number
Pages / Duration
116827
Patent number
Publisher / Publishing institution
Elsevier
Place of publication / Event location
Edition
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ISBN
ISSN
0032-5910
1873-328X
1873-328X
Language
English
Created during FHNW affiliation
No
Strategic action fields FHNW
Publication status
Published
Review
peer-reviewed
Open access category
License
Citation
Neoptolemou, P., Goyal, N., Cruz-Cabeza, A. J., Kiss, A. A., Milne, D. J., & Vetter, T. (2022). A novel image analysis technique for 2D characterization of overlapping needle-like crystals. Powder Technology, 399, 116827. https://doi.org/10.1016/j.powtec.2021.09.017