A method for side effect analysis based on electricfield simulations for intraoperative test stimulation in deep brain stimulation surgery

dc.accessRightsAnonymous
dc.audienceScience
dc.contributor.authorPison, Daniela
dc.contributor.authorAlonso, Fabiola
dc.contributor.authorWårdell, Karin
dc.contributor.authorShah, Ashesh
dc.contributor.authorCoste, Jérôme
dc.contributor.authorLemaire, Jean-Jaques
dc.contributor.authorSchkommodau, Erik
dc.contributor.authorHemm-Ode, Simone
dc.date.accessioned2015-12-16T14:45:13Z
dc.date.available2015-12-16T14:45:13Z
dc.date.issued2015
dc.description.urihttp://wc2015.org/wp-content/uploads/2015/04/IUPESM-Scientific-Program-Website-oral.pdf
dc.eventWorld Congress on Medical Physics and Biomedical Engineering (IUPESM 2015)
dc.identifier.urihttp://hdl.handle.net/11654/11824
dc.language.isodeen_US
dc.relation.ispartofWorld Congress on Medical Physics and Biomedical Engineering (IUPESM)
dc.spatialToronto
dc.titleA method for side effect analysis based on electricfield simulations for intraoperative test stimulation in deep brain stimulation surgery
dc.type04B - Beitrag Konferenzschrift
dspace.entity.typePublication
fhnw.InventedHereYes
fhnw.IsStudentsWorkno
fhnw.PublishedSwitzerlandYes
fhnw.ReviewTypeNo peer review
fhnw.affiliation.hochschuleHochschule für Life Sciences FHNWde_CH
fhnw.affiliation.institutInstitut für Chemie und Bioanalytikde_CH
fhnw.publicationStatePublished
relation.isAuthorOfPublication1fc46c50-0011-46d9-ae30-10137451a871
relation.isAuthorOfPublication9923d614-4703-4154-9ba4-68841c45df23
relation.isAuthorOfPublicationdc969cae-4775-4db5-a3c7-f4e32a96f1f2
relation.isAuthorOfPublication751f4aee-97bb-4592-91f2-6e3e4623de25
relation.isAuthorOfPublication.latestForDiscovery9923d614-4703-4154-9ba4-68841c45df23
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