An improved efficiency of all-PMOS charge pump circuit

Abstract

This paper presents an all-PMOS charge-pump cell that enhances efficiency using advanced bulk-bias techniques. Traditional designs struggle with switching losses and threshold voltage effects, especially under low voltage or high-frequency conditions. Our design mitigates these issues by optimizing charge transfer through improved bulk management. The proposed architecture shows significant efficiency gains, validated through theoretical analysis and experimental results, making it a robust solution for efficient DC-DC conversion applications.