Affinity for Technology - a possible instrument to measure PATT (Pubils Attitude Towards Technology)?

dc.accessRightsAnonymous
dc.audienceSonstige
dc.contributor.authorGüdel, Karin
dc.contributor.authorHeitzmann, Anni
dc.contributor.editorde Vries, Marc J.
dc.date.accessioned2016-01-27T13:32:35Z
dc.date.available2016-01-27T13:32:35Z
dc.date.issued2015
dc.identifier.urihttp://hdl.handle.net/11654/13058
dc.language.isodeen_US
dc.relation.ispartof29th patt Conference Proceedings. Ecole Supérieure du Professorat et de l'Education, Marseille
dc.subject.ddc370 - Erziehung, Schul- und Bildungswesen
dc.titleAffinity for Technology - a possible instrument to measure PATT (Pubils Attitude Towards Technology)?
dc.type04B - Beitrag Konferenzschrift
dspace.entity.typePublication
fhnw.InventedHereYes
fhnw.ReviewTypeAnonymous ex ante peer review of a complete publication
fhnw.affiliation.hochschulePädagogische Hochschule FHNWde_CH
fhnw.affiliation.institutInstitut Sekundarstufe I und IIde_CH
fhnw.publicationStateunbekannt
relation.isAuthorOfPublication7ec9830e-8ab8-4b33-a93f-1396a9b6d488
relation.isAuthorOfPublication.latestForDiscovery7ec9830e-8ab8-4b33-a93f-1396a9b6d488
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Institut Sekundarstufe I und II