Measuring a Small Number of Samples, and the 3σ Fallacy. Shedding Light on Confidence and Error Intervals

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dc.contributor.authorSchmid, Hanspeter
dc.contributor.authorHuber, Alexander
dc.date.accessioned2016-04-06T14:25:38Z
dc.date.available2016-04-06T14:25:38Z
dc.date.issued2014
dc.identifier.issn1943-0590
dc.identifier.issn1943-0582
dc.identifier.urihttp://hdl.handle.net/11654/17733
dc.issue2
dc.publisherIEEEen_US
dc.relation.ispartofIEEE Solid-State Circuits Magazineen_US
dc.titleMeasuring a Small Number of Samples, and the 3σ Fallacy. Shedding Light on Confidence and Error Intervals
dc.type01A - Beitrag in wissenschaftlicher Zeitschrift
dc.volume6
dspace.entity.typePublication
fhnw.InventedHereJa
fhnw.affiliation.hochschuleHochschule für Technikde_CH
fhnw.affiliation.institutlnstitut für Sensorik und Elektronikde_CH
fhnw.pagination52-58
relation.isAuthorOfPublicationa9b76c86-e03e-415d-b9fc-2221d66934fd
relation.isAuthorOfPublication911e2394-19ba-4b7d-b8bc-84e2a01e8e53
relation.isAuthorOfPublication.latestForDiscoverya9b76c86-e03e-415d-b9fc-2221d66934fd
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