REFO-SVM. Optimized PWM for thermal stress and gate switching instability mitigation in SiC MOSFETs

dc.contributor.authorRezaeizadeh, Amin
dc.contributor.authorMastellone, Silvia
dc.date.accessioned2025-06-11T09:04:32Z
dc.date.issued2025-05-27
dc.description.abstractThis paper proposes an optimized modulation mechanism for a two-level three-phase power electronics converter. The optimal switch selection is designed to address the two degradation factors in SiC MOSFETs: bond-wire lift-off and gate switching instability (GSI). The switching principle is based on space vector modulation (SVM) principle, however, in any voltage angle, one of the legs will be entirely either on or off to reduce the number of switching. Furthermore, the duty cycles are computed based on reducing the thermal stress of the switching devices. The simulation results are compared to three other SVM-based modulation techniques.
dc.identifier.urihttps://irf.fhnw.ch/handle/11654/51640
dc.identifier.urihttps://doi.org/10.26041/fhnw-12823
dc.language.isoen
dc.publisherHochschule für Technik und Umwelt FHNW
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/
dc.spatialWindisch
dc.subjectSiC MOSFET
dc.subjectreliability
dc.subjectgate switching instability
dc.subjectspace vector modulation
dc.subject.ddc620 - Ingenieurwissenschaften und Maschinenbau
dc.titleREFO-SVM. Optimized PWM for thermal stress and gate switching instability mitigation in SiC MOSFETs
dc.type05 - Forschungs- oder Arbeitsbericht
dspace.entity.typePublication
fhnw.InventedHereYes
fhnw.ReviewTypeNo peer review
fhnw.affiliation.hochschuleHochschule für Technik und Umwelt FHNWde_CH
fhnw.affiliation.institutInstitut für Elektrische Energietechnikde_CH
fhnw.publicationStatePre-Print
fhnw.strategicActionFieldZero Emission
relation.isAuthorOfPublication660ce7b1-27cc-47c2-8d39-1f34f2ca168a
relation.isAuthorOfPublicationdfa00cae-b3d6-4d4a-8926-d15d6a761bf9
relation.isAuthorOfPublication.latestForDiscovery660ce7b1-27cc-47c2-8d39-1f34f2ca168a
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