A method for side effect analysis based on electricfield simulations for intraoperative test stimulation in deep brain stimulation surgery
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Authors
Alonso, Fabiola
Wårdell, Karin
Coste, Jérôme
Lemaire, Jean-Jaques
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2015
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04B - Conference paper
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World Congress on Medical Physics and Biomedical Engineering (IUPESM)
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Toronto
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World Congress on Medical Physics and Biomedical Engineering (IUPESM 2015)
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German
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Yes
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Published
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No peer review
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Citation
Pison, D., Alonso, F., Wårdell, K., Shah, A., Coste, J., Lemaire, J.-J., Schkommodau, E., & Hemm-Ode, S. (2015). A method for side effect analysis based on electricfield simulations for intraoperative test stimulation in deep brain stimulation surgery. World Congress on Medical Physics and Biomedical Engineering (IUPESM). World Congress on Medical Physics and Biomedical Engineering (IUPESM 2015). http://hdl.handle.net/11654/11824