Ion beam preparation procedures for three-dimensional SEM resolved Kikuchi (EBSD) and Kossel microdiffraction analysis of deformed metals

Loading...
Thumbnail Image
Author (Corporation)
Publication date
08/2005
Typ of student thesis
Course of study
Type
01A - Journal article
Editors
Editor (Corporation)
Supervisor
Parent work
Microscopy and Microanalysis
Special issue
DOI of the original publication
Link
Series
Series number
Volume
11
Issue / Number
S02
Pages / Duration
840-841
Patent number
Publisher / Publishing institution
Oxford University Press
Place of publication / Event location
Edition
Version
Programming language
Assignee
Practice partner / Client
Keywords
Project
Event
Exhibition start date
Exhibition end date
Conference start date
Conference end date
Date of the last check
ISBN
ISSN
1431-9276
Language
English
Created during FHNW affiliation
No
Strategic action fields FHNW
Publication status
Published
Review
Peer review of the abstract
Open access category
Closed
License
Citation
Hauffe, W., Simons, G., Kunze, K., Langer, E., & Mitro, R. J. (2005). Ion beam preparation procedures for three-dimensional SEM resolved Kikuchi (EBSD) and Kossel microdiffraction analysis of deformed metals. Microscopy and Microanalysis, 11(S02), 840–841. https://doi.org/10.1017/s1431927605500023