Ion beam preparation procedures for three-dimensional SEM resolved Kikuchi (EBSD) and Kossel microdiffraction analysis of deformed metals
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Author (Corporation)
Publication date
08.2005
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01A - Journal article
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Microscopy and Microanalysis
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Volume
11
Issue / Number
S02
Pages / Duration
840-841
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Publisher / Publishing institution
Oxford University Press
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ISSN
1431-9276
Language
English
Created during FHNW affiliation
No
Strategic action fields FHNW
Publication status
Published
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peer-reviewed
Open access category
Closed
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Citation
Hauffe, W., Simons, G., Kunze, K., Langer, E., & Mitro, R. J. (2005). Ion beam preparation procedures for three-dimensional SEM resolved Kikuchi (EBSD) and Kossel microdiffraction analysis of deformed metals. Microscopy and Microanalysis, 11(S02), 840–841. https://doi.org/10.1017/s1431927605500023