An improved efficiency of all-PMOS charge pump circuit
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Authors
Author (Corporation)
Publication date
2024
Typ of student thesis
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Type
04B - Conference paper
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Parent work
2024 31st IEEE International Conference on Electronics, Circuits and Systems (ICECS)
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Issue / Number
Pages / Duration
1-2
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Publisher / Publishing institution
IEEE
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Abstract
This paper presents an all-PMOS charge-pump cell that enhances efficiency using advanced bulk-bias techniques. Traditional designs struggle with switching losses and threshold voltage effects, especially under low voltage or high-frequency conditions. Our design mitigates these issues by optimizing charge transfer through improved bulk management. The proposed architecture shows significant efficiency gains, validated through theoretical analysis and experimental results, making it a robust solution for efficient DC-DC conversion applications.
Keywords
Charge pumps, Low voltage, Microprocessors, Switching loss, Computer architecture, Threshold voltage, Charge transfer, Electronic circuits, Charge-pump, Bulk-biasing, DC-DC conversion, Switching losses, Power management, Low-power design
Subject (DDC)
Event
31st IEEE International Conference on Electronics, Circuits and Systems (ICECS)
Exhibition start date
Exhibition end date
Conference start date
18.11.2024
Conference end date
20.11.2024
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ISSN
Language
English
Created during FHNW affiliation
Yes
Strategic action fields FHNW
Zero Emission
Publication status
Published
Review
Peer review of the complete publication
Open access category
Closed
License
Citation
Coustans, M. (2024). An improved efficiency of all-PMOS charge pump circuit. 2024 31st IEEE International Conference on Electronics, Circuits and Systems (ICECS), 1–2. https://doi.org/10.1109/ICECS61496.2024.10849207