Affinity for Technology - a possible instrument to measure PATT (Pubils Attitude Towards Technology)?
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Authors
Heitzmann, Anni
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Publication date
2015
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04B - Conference paper
Editors
de Vries, Marc J.
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Parent work
29th patt Conference Proceedings. Ecole Supérieure du Professorat et de l'Education, Marseille
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370 - Erziehung, Schul- und Bildungswesen
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Language
German
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Yes
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Unknown
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Peer review of the complete publication
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Citation
GÜDEL, Karin und Anni HEITZMANN, 2015. Affinity for Technology - a possible instrument to measure PATT (Pubils Attitude Towards Technology)? In: Marc J. DE VRIES (Hrsg.), 29th patt Conference Proceedings. Ecole Supérieure du Professorat et de l’Education, Marseille. 2015. Verfügbar unter: http://hdl.handle.net/11654/13058