Scanning gate microscope for cold atomic gases
Loading...
Author (Corporation)
Publication date
2017
Typ of student thesis
Course of study
Collections
Type
01A - Journal article
Editors
Editor (Corporation)
Supervisor
Parent work
Physical Review Letters
Special issue
DOI of the original publication
Link
Series
Series number
Volume
119
Issue / Number
3
Pages / Duration
Patent number
Publisher / Publishing institution
American Physical Society
Place of publication / Event location
Edition
Version
Programming language
Assignee
Practice partner / Client
Keywords
Subject (DDC)
Event
Exhibition start date
Exhibition end date
Conference start date
Conference end date
Date of the last check
ISBN
ISSN
0031-9007
1079-7114
1079-7114
Language
English
Created during FHNW affiliation
No
Strategic action fields FHNW
Publication status
Published
Review
Peer review of the complete publication
Open access category
Closed
License
Citation
Häusler, S., Nakajima, S., Lebrat, M., Husmann, D., Krinner, S., Esslinger, T., & Brantut, J.-P. (2017). Scanning gate microscope for cold atomic gases. Physical Review Letters, 119(3). https://doi.org/10.1103/PhysRevLett.119.030403