Scanning gate microscope for cold atomic gases
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Author (Corporation)
Publication date
2017
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Type
01A - Journal article
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Parent work
Physical Review Letters
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Volume
119
Issue / Number
3
Pages / Duration
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Publisher / Publishing institution
American Physical Society
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ISSN
0031-9007
1079-7114
1079-7114
Language
English
Created during FHNW affiliation
No
Strategic action fields FHNW
Publication status
Published
Review
peer-reviewed
Open access category
Closed
License
Citation
Häusler, S., Nakajima, S., Lebrat, M., Husmann, D., Krinner, S., Esslinger, T., & Brantut, J.-P. (2017). Scanning gate microscope for cold atomic gases. Physical Review Letters, 119(3). https://doi.org/10.1103/PhysRevLett.119.030403