A short note on frequency-domain damage calculation for power semiconductors reliability control design

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10.02.2025
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05 - Research report or working paper
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Fachhochschule Nordwestschweiz FHNW
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Windisch
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Abstract
In this short note, we give a simple derivation of the damage calculation for power semiconductors based on the frequency-domain approximation of damage. This analysis can be further used to design linear control systems aimed at reducing the damage to the semiconductor switches in power converters.
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semiconductors lifetime, frequency-domain fatigue analysis, reliability
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English
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Yes
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Zero Emission
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Unpublished
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No peer review
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'https://creativecommons.org/licenses/by/4.0/'
Citation
Rezaeizadeh, A., & Mastellone, S. (2025). A short note on frequency-domain damage calculation for power semiconductors reliability control design. Fachhochschule Nordwestschweiz FHNW. https://doi.org/10.26041/fhnw-11938